System-Level BIST for Programmable I/O Cells in FPGAs and SoCs
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چکیده
A Built-In Self-Test (BIST) approach is presented for system-level testing of the programmable Input/Output (I/O) buffers in Field Programmable Gate Arrays (FPGAs) and configurable System-on-Chip (SoC). We discuss implementation methods for the BIST approach, including parameterized VHDL and FPGA-specific hardware design description languages. The fault detection capabilities and limitations of the BIST approach are presented along with the results of the application of the various implementation methods to several commercially available FPGAs and SoCs. 1
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تاریخ انتشار 2006